Three‐dimensional probe reconstruction for atomic force microscopy

نویسندگان
چکیده

برای دانلود رایگان متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید

اگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید

منابع مشابه

Three-dimensional Probe and Surface Reconstruction for Atomic Force Microscopy Using a Deconvolution Algorithm

Atomic force microscope (AFM) images often contain distortions caused by the convolution of the tip and sample surface. The offered numerical deconvolution, with the use of an inverted tip located at a constant height from the surface, noticeably differs from methods previously published and is essentially simple for a concrete practical realization. Nanometer-sized spheres were successfully us...

متن کامل

Atomic Force Microscopy Application in Biological Research: A Review Study

Atomic force microscopy (AFM) is a three-dimensional topographic technique with a high atomic resolution to measure surface roughness. AFM is a kind of scanning probe microscope, and its near-field technique is based on the interaction between a sharp tip and the atoms of the sample surface. There are several methods and many ways to modify the tip of the AFM to investigate surface properties, ...

متن کامل

Understanding the atomic-scale contrast in Kelvin probe force microscopy.

A numerical analysis of the origin of the atomic-scale contrast in Kelvin probe force microscopy is presented. Atomistic simulations of the tip-sample interaction force field have been combined with a noncontact atomic force microscope simulator including a Kelvin module. The implementation mimics recent experimental results on the (001) surface of a bulk alkali halide crystal for which simulta...

متن کامل

Conductive-probe atomic force microscopy characterization of silicon nanowire

The electrical conduction properties of lateral and vertical silicon nanowires (SiNWs) were investigated using a conductive-probe atomic force microscopy (AFM). Horizontal SiNWs, which were synthesized by the in-plane solid-liquid-solid technique, are randomly deployed into an undoped hydrogenated amorphous silicon layer. Local current mapping shows that the wires have internal microstructures....

متن کامل

Atomic force microscopy and other scanning probe microscopies.

The highlight of the past year is the unfolding and refolding of the muscle protein titin in the atomic force microscope. A related highlight in the intersection between experiment and theory is a recent review of the effects of molecular forces on biochemical kinetics. Other advances in scanning probe microscopy include entropic brushes, molecular sandwiches and applications of atomic force mi...

متن کامل

ذخیره در منابع من


  با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید

ژورنال

عنوان ژورنال: Review of Scientific Instruments

سال: 1994

ISSN: 0034-6748,1089-7623

DOI: 10.1063/1.1144735