Three‐dimensional probe reconstruction for atomic force microscopy
نویسندگان
چکیده
منابع مشابه
Three-dimensional Probe and Surface Reconstruction for Atomic Force Microscopy Using a Deconvolution Algorithm
Atomic force microscope (AFM) images often contain distortions caused by the convolution of the tip and sample surface. The offered numerical deconvolution, with the use of an inverted tip located at a constant height from the surface, noticeably differs from methods previously published and is essentially simple for a concrete practical realization. Nanometer-sized spheres were successfully us...
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ژورنال
عنوان ژورنال: Review of Scientific Instruments
سال: 1994
ISSN: 0034-6748,1089-7623
DOI: 10.1063/1.1144735